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Artigo de periodico
Novel near field detector for three-dimensional X-ray diffraction microscopy (2018)
Annett, Scott; Kycia, Stefan; Dale, Darren; Morelhao, Sergio Luiz
Source: MRS Advances. Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, SEMICONDUTORES, CRISTALOGRAFIA DE RAIOS X
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
ANNETT, Scott et al. Novel near field detector for three-dimensional X-ray diffraction microscopy. MRS Advances, v. 3, n. ju 2018, p. 2341-2346, 2018Tradução . . Disponível em: https://doi.org/10.1557/adv.2018.487. Acesso em: 30 abr. 2024.
APA
Annett, S., Kycia, S., Dale, D., & Morelhao, S. L. (2018). Novel near field detector for three-dimensional X-ray diffraction microscopy. MRS Advances, 3( ju 2018), 2341-2346. doi:10.1557/adv.2018.487
NLM
Annett S, Kycia S, Dale D, Morelhao SL. Novel near field detector for three-dimensional X-ray diffraction microscopy [Internet]. MRS Advances. 2018 ; 3( ju 2018): 2341-2346.[citado 2024 abr. 30 ] Available from: https://doi.org/10.1557/adv.2018.487
Vancouver
Annett S, Kycia S, Dale D, Morelhao SL. Novel near field detector for three-dimensional X-ray diffraction microscopy [Internet]. MRS Advances. 2018 ; 3( ju 2018): 2341-2346.[citado 2024 abr. 30 ] Available from: https://doi.org/10.1557/adv.2018.487
Artigo de periodico
Micro grain analysis in plastically deformed silicon by 2nd-order X-ray diffraction (2018)
Dina, Gabriel; Kycia, Stefan; Gonzalez, Anal Gomez; Morelhao, Sergio Luiz
Source: MRS Advances. Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, SEMICONDUTORES, CRISTALOGRAFIA DE RAIOS X
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
DINA, Gabriel et al. Micro grain analysis in plastically deformed silicon by 2nd-order X-ray diffraction. MRS Advances, v. 3, n. ju 2018, p. 2347-2352, 2018Tradução . . Disponível em: https://doi.org/10.1557/adv.2018.511. Acesso em: 30 abr. 2024.
APA
Dina, G., Kycia, S., Gonzalez, A. G., & Morelhao, S. L. (2018). Micro grain analysis in plastically deformed silicon by 2nd-order X-ray diffraction. MRS Advances, 3( ju 2018), 2347-2352. doi:10.1557/adv.2018.511
NLM
Dina G, Kycia S, Gonzalez AG, Morelhao SL. Micro grain analysis in plastically deformed silicon by 2nd-order X-ray diffraction [Internet]. MRS Advances. 2018 ; 3( ju 2018): 2347-2352.[citado 2024 abr. 30 ] Available from: https://doi.org/10.1557/adv.2018.511
Vancouver
Dina G, Kycia S, Gonzalez AG, Morelhao SL. Micro grain analysis in plastically deformed silicon by 2nd-order X-ray diffraction [Internet]. MRS Advances. 2018 ; 3( ju 2018): 2347-2352.[citado 2024 abr. 30 ] Available from: https://doi.org/10.1557/adv.2018.511
Artigo de periodico
Kinetics of silver nanoparticle release from chitosan spheres (2017)
Vercik, Luci Cristina de Oliveira; Vercik, Andrés; Rigo, Eliana Cristina da Silva
Source: MRS Advances. Unidade: FZEA
Subjects: CINÉTICA, NANOPARTÍCULAS, PRATA, QUITOSANA, POLÍMEROS (MATERIAIS)
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
VERCIK, Luci Cristina de Oliveira e VERCIK, Andrés e RIGO, Eliana Cristina da Silva. Kinetics of silver nanoparticle release from chitosan spheres. MRS Advances, v. 2, n. 19/20, p. 1089-1094, 2017Tradução . . Disponível em: https://doi.org/10.1557/adv.2017.48. Acesso em: 30 abr. 2024.
APA
Vercik, L. C. de O., Vercik, A., & Rigo, E. C. da S. (2017). Kinetics of silver nanoparticle release from chitosan spheres. MRS Advances, 2( 19/20), 1089-1094. doi:10.1557/adv.2017.48
NLM
Vercik LC de O, Vercik A, Rigo EC da S. Kinetics of silver nanoparticle release from chitosan spheres [Internet]. MRS Advances. 2017 ; 2( 19/20): 1089-1094.[citado 2024 abr. 30 ] Available from: https://doi.org/10.1557/adv.2017.48
Vancouver
Vercik LC de O, Vercik A, Rigo EC da S. Kinetics of silver nanoparticle release from chitosan spheres [Internet]. MRS Advances. 2017 ; 2( 19/20): 1089-1094.[citado 2024 abr. 30 ] Available from: https://doi.org/10.1557/adv.2017.48

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